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Diffraction Data for SRM 640f
Published by National Institute of Standards and Technology · Updated 06/01/2020
- Last updated
- 06/01/2020
- First published 06/22/2020
- Update frequency
- Not listed
- Formats
- 2
- ZIP, TXT
- Coverage
- Nationwide
- Federal data
About this dataset
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.
Files and access
Links open the official government source
- Diffraction Data for SRM 640fdata.nist.govZIP
- SHA256 File for Diffraction Data for SRM 640fdata.nist.govTXT
- DOI Access for Diffraction Data for SRM 640fdoi.org
Links open outside websites we do not control.
Frequently asked questions
- Who publishes Diffraction Data for SRM 640f?
- National Institute of Standards and Technology, part of Department of Commerce, publishes this dataset on Data.gov.
- How often is it updated?
- The publisher does not list a schedule. The last update was on 06/01/2020.
- How do I download it?
- It is available as ZIP, TXT. Use the links in Files and access, which open the official government source.
Where this catalog comes from
- Data.gov CatalogU.S. General Services Administration
- State and local open data portalsSocrata Discovery API
- State and city CKAN portalsCalifornia, Virginia, Boston, Houston and more
- Government ArcGIS Hub sitesCity and county GIS data
Catalog checked 10/24/2026
We list dataset descriptions only. Downloads and APIs link straight to the official government source, which holds the current version and its terms of use.
Source: Data.gov · Last updated 10/24/2026 · Listing only; the data stays with the publisher
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